Dielectric property measurement of nonlinear grading materials

Programs are being developed which can solve the electric field distribution in systems which include nonlinear dielectric materials, i.e., materials for which the dielectric constant and/or electrical conductivity is a function of field parameters such as electric field and, possibly, temperature. However, measurement of input parameters for such programs, i.e., the dielectric properties as a function of field and temperature, is problematic. This paper considers the options for such measurements.