DocumentCode :
2630214
Title :
Sensitivity-optimized wide-field imaging with a CZT-based coded mask imager
Author :
Skelton, Robert T. ; Matteson, James L. ; Cardoso, Bill
Author_Institution :
University of California San Diego, Center for Astrophysics and Space Sciences, La Jolla, 92093 USA
fYear :
2008
fDate :
19-25 Oct. 2008
Firstpage :
468
Lastpage :
471
Abstract :
Coded mask imaging can produce excellent images in the hard X-ray range from ∼10 to 200 keV, and up to several MeV in the gamma-ray range. Sub-degree resolution is obtained for hard X-rays and a few-degree resolution for gamma-rays. However, these capabilities are realized with large instruments, several meters in length, and limited fields of view, tens of degrees, which are not suitable for large-area surveillance to assess radiological threats. We have developed coded mask imaging techniques to address this deficiency. They operate into the MeV range and provide high sensitivity over a wide FOV, 140 degrees, with a single instrument. This is possible by designing for limited angular resolution, ∼20 degrees, in order to reduce the otherwise negative consequence of vignetting by the mask. With this resolution, few-degree localizations are obtained with detections of ∼10 sigma significance, which usually provides adequate positioning to associate a radiation source with a specific object for follow-up investigation. We report on the design, modeling, and tests of a hand-held CZT-based coded mask imager that uses these techniques to image a 140 degree FOV with a nearly constant resolution of 20 degrees. The 7.5 mm thick coded mask provides good modulation and, therefore, good sensitivity up to 1 MeV and beyond, and the sensitivity is nearly uniform across the FOV due to an optimized coded mask/detector array design. The imager employs CZT pixel detectors that provide ∼1% energy resolution at 662 keV
Keywords :
High-resolution imaging; Image resolution; Instruments; Modulation coding; Object detection; Optical imaging; Radiation detectors; Surveillance; Testing; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location :
Dresden, Germany
ISSN :
1095-7863
Print_ISBN :
978-1-4244-2714-7
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2008.4775209
Filename :
4775209
Link To Document :
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