DocumentCode
2630245
Title
Behaviour of the metal-oxide-fluid-interface
Author
Julliard, Y. ; Kist, K. ; Badent, R. ; Schwab, A.J.
Author_Institution
Inst. of Electr. Energy Syst., Karlsruhe Univ., Germany
Volume
2
fYear
2000
fDate
15-18 Oct. 2000
Firstpage
780
Abstract
Surface phenomena at electrodes play a major role in streamer inception. Metal-electrodes are always covered with oxide-layers, changing the electrical and chemical properties of the metal-surface. Semiconducting metal-oxide structures arise at the surface. For experiments, oxide covered metal electrodes are dipped into the liquid. A double layer-structure with an inner and outer Helmholtz plane and a subsequent diffuse layer are established at the metal-oxide-liquid interface. Charge transport from and into the liquid is controlled by the electrical properties of the metal-oxide-double-layer structure. Streamer inception modifies the structure of these surface layers and leads to restructuring at the interface and in the liquid bulk. A model for the behaviour of the metal-oxide-liquid interface using percolation theory concepts is presented as well as experimental investigations of surface structures of electrodes used in experiments. Oxide layers found on brass electrodes as well as the impact of streamer inception on electrode surfaces is presented.
Keywords
charge injection; discharges (electric); interface states; metal-insulator boundaries; percolation; semiconductor-metal boundaries; space charge; brass electrodes; charge transport; diffuse layer; double layer-structure; electrode surface structures; electrode surfaces; inner Helmholtz plane; interface states; metal-oxide-liquid interface; outer Helmholtz plane; oxide covered metal electrodes; oxide layers; percolation theory; semiconducting metal-oxide structures; space charge; streamer inception; surface chemical properties; surface electrical properties; Charge carriers; Chemical technology; Dielectric liquids; Electrochemical processes; Electrodes; Energy states; Lattices; Oil insulation; Photonic band gap; Surface structures;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 2000 Annual Report Conference on
Print_ISBN
0-7803-6413-9
Type
conf
DOI
10.1109/CEIDP.2000.884074
Filename
884074
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