DocumentCode :
2630265
Title :
Fabrication and test of pixelated CZT detectors with different pixel pitches and thicknesses
Author :
Li, Qiang ; Garson, Alfred III ; Dowkontt, Paul ; Martin, Jerrad ; Beilicke, Matthias ; Jung, Ira ; Groza, Michael ; Burger, Arnold ; De Geronimo, G. ; Krawczynski, Henrie
Author_Institution :
Dept. of Physics and the McDonnell Center for the Space Sciences, Washington University in St. Louis, 1 Brookings Dr., CB 1105, St Louis, MO 63130, USA
fYear :
2008
fDate :
19-25 Oct. 2008
Firstpage :
484
Lastpage :
489
Abstract :
The main methods grown Cadmium Zinc Telluride (CZT) crystals with high yield and excellent homogeneity are Modified Horizontal Bridgman (MHB) and High Pressure Bridgman (HPB) processes, respectively. In this contribution, the readout system based on two 32-channel NCI-ASICs for pixelated CZT detector arrays has been developed and tested. The CZT detectors supplied by Orbotech (MHB) and eV products (HPB) are tested by NCI-ASIC readout system. The CZT detectors have an array of 8×8 or 11×11 pixel anodes fabricated on the anode surface with the area up to 2 cm × 2 cm and the thickness of CZT detectors ranges from 0.5 cm to 1 cm. Energy spectra resolution and electron mobility-lifetime products of 8×8 pixels CZT detector with different thicknesses have been investigated.
Keywords :
Anodes; Cadmium compounds; Crystals; Detectors; Electron mobility; Energy resolution; Fabrication; Sensor arrays; System testing; Zinc compounds;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location :
Dresden, Germany
ISSN :
1095-7863
Print_ISBN :
978-1-4244-2714-7
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2008.4775212
Filename :
4775212
Link To Document :
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