Title :
Focused evanescent field under radially polarized beam illumination
Author :
Jia, Baohua ; Gan, Xiaosong ; Gu, Min
Author_Institution :
Fac. of Eng. & Ind. Sci., Swinburne Univ. of Technol., Hawthorn, Vic., Australia
Abstract :
In order to eliminate the focus deformation and at the same time localize the field near the interface, a tightly focused evanescent field combining with a radially polarized illumination, generated by interference method with a single LCD, is proposed in this paper. A scanning near-field optical microscope (SNOM) has been employed to observe the focal spot near the interface by means of directly scanning over the focal field.
Keywords :
light polarisation; liquid crystal displays; near-field scanning optical microscopy; optical focusing; LCD; SNOM; focused evanescent field; interference method; radially polarized beam illumination; scanning near-field optical microscope; Australia; Focusing; Gallium nitride; High-resolution imaging; Lenses; Lighting; Optical imaging; Optical microscopy; Optical polarization; Optical surface waves;
Conference_Titel :
Lasers and Electro-Optics Society, 2005. LEOS 2005. The 18th Annual Meeting of the IEEE
Print_ISBN :
0-7803-9217-5
DOI :
10.1109/LEOS.2005.1547940
