DocumentCode :
2631494
Title :
Constrained free form deformation based algorithm for geometric distortion correction of echo planar diffusion tensor images
Author :
Ardekani, Siamak ; Sinha, Usha
Author_Institution :
Biomedical Eng. Interdepartmental Program, California Univ., Los Angeles, CA, USA
fYear :
2004
fDate :
15-18 April 2004
Firstpage :
340
Abstract :
In order to differentiate between normal and abnormal variations in brain diffusion tensor images, it is necessary to develop medical atlases. Atlas creation requires removal of spatial distortions in individual subject diffusion weighted images. In this paper we suggest a new approach using non-linear warping based on optic flow to map both baseline and diffusion weighted echo planar images to the anatomically correct T2 weighted spin echo image. The method is readily implemented and does not require a pre-processing step of rigid alignment. A global histogram matching precedes the base line EP image correction. A Markov random field based classification algorithm was implemented to cluster T2 weighted images into four different tissue type classes. This information was then used to synthesize diffusion based image models used in the warping algorithm to correct the geometric distortions in the diffusion weighted EP images.
Keywords :
Markov processes; biodiffusion; biological tissues; biomedical MRI; brain; image classification; image sequences; medical image processing; Markov random field based classification algorithm; anatomically correct T2 weighted spin echo image; constrained free form deformation; echo planar brain diffusion tensor images; geometric distortion correction; global histogram matching; image correction; medical atlases; nonlinear warping; optic flow; tissue type; Biomedical imaging; Biomedical optical imaging; Clustering algorithms; Histograms; Image motion analysis; Markov random fields; Nonlinear distortion; Nonlinear optics; Optical distortion; Tensile stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: Nano to Macro, 2004. IEEE International Symposium on
Print_ISBN :
0-7803-8388-5
Type :
conf
DOI :
10.1109/ISBI.2004.1398544
Filename :
1398544
Link To Document :
بازگشت