Title :
VHDL-based distributed fault simulation using SAVANT
Author :
Baucom, Ryan J. ; DeLong, Todd A. ; Smith, D. Todd ; Johnson, Barry W. ; Hanna, James P.
Author_Institution :
Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
Abstract :
There is a need for simulator-independent, VHDL-based fault simulation. Existing techniques for VHDL-based fault simulation are reviewed. Robust, a simulator-independent fault simulator tool, is described. Slow simulation speed is identified as one limitation of the current Robust tool and distributed simulation on a network of workstations is identified as a feasible way to improve its performance. Previous network-of-workstations fault simulation experiments are reviewed. Current efforts to enhance the Robust tool using SAVANT ate described. A system using Robust (with SAVANT extensions) for fault simulation on a network of workstations is proposed, using the TyVIS VHDL simulation kernel and the Legion distributed processing system
Keywords :
automatic test software; circuit testing; digital simulation; distributed processing; fault simulation; hardware description languages; Legion distributed processing; Robust tool; SAVANT; TyVIS VHDL simulation kernel; VHDL; distributed fault simulation; fault set partitioning; network of workstations; Circuit faults; Circuit simulation; Circuit testing; Distributed processing; Electrical fault detection; Fault detection; Laboratories; Robustness; Test pattern generators; Workstations;
Conference_Titel :
Aerospace and Electronics Conference, 1998. NAECON 1998. Proceedings of the IEEE 1998 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-4449-9
DOI :
10.1109/NAECON.1998.710203