DocumentCode
2632602
Title
Extreme group index measured and calculated in 2D SOI-based photonic crystal waveguides
Author
Lavrinenko, Andrei V. ; Jacobsen, Rune S. ; Fage-Pedersen, Jacob ; Frandsen, Lars H. ; Zsigri, Beata ; Peucheret, Christophe ; Borel, Peter I.
Author_Institution
Tech. Univ. Denmark, Lyngby
fYear
2005
fDate
22-22 Oct. 2005
Firstpage
337
Lastpage
338
Abstract
The paper reports on the measurement and evaluation of the group velocity (GV) dispersion in the proximity of the cutoff wavelength for the fundamental photonic bandgap mode in a 2D photonic crystal waveguide (PCW). The PCW is created by introducing a line defect in an otherwise perfect triangular lattice of air-holes in the 216-nm thick silicon layer in an SOI material. Experimental transmission spectra show a mode cut-off around 1562.5 nm for the fundamental photonic bandgap mode. In order to measure and model the group index of modes in the PCW, a time-of-flight (ToF) method is applied
Keywords
optical variables measurement; optical waveguides; photonic crystals; silicon-on-insulator; 2D SOI-based photonic crystal waveguides; group index measurement; group velocity dispersion; line defect; time-of-flight method; transmission spectra; Crystalline materials; Detectors; Jacobian matrices; Nonlinear optics; Optical waveguides; Phase measurement; Photonic crystals; Silicon; Slow light; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society, 2005. LEOS 2005. The 18th Annual Meeting of the IEEE
Conference_Location
Sydney, NSW
Print_ISBN
0-7803-9217-5
Type
conf
DOI
10.1109/LEOS.2005.1548008
Filename
1548008
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