• DocumentCode
    2632602
  • Title

    Extreme group index measured and calculated in 2D SOI-based photonic crystal waveguides

  • Author

    Lavrinenko, Andrei V. ; Jacobsen, Rune S. ; Fage-Pedersen, Jacob ; Frandsen, Lars H. ; Zsigri, Beata ; Peucheret, Christophe ; Borel, Peter I.

  • Author_Institution
    Tech. Univ. Denmark, Lyngby
  • fYear
    2005
  • fDate
    22-22 Oct. 2005
  • Firstpage
    337
  • Lastpage
    338
  • Abstract
    The paper reports on the measurement and evaluation of the group velocity (GV) dispersion in the proximity of the cutoff wavelength for the fundamental photonic bandgap mode in a 2D photonic crystal waveguide (PCW). The PCW is created by introducing a line defect in an otherwise perfect triangular lattice of air-holes in the 216-nm thick silicon layer in an SOI material. Experimental transmission spectra show a mode cut-off around 1562.5 nm for the fundamental photonic bandgap mode. In order to measure and model the group index of modes in the PCW, a time-of-flight (ToF) method is applied
  • Keywords
    optical variables measurement; optical waveguides; photonic crystals; silicon-on-insulator; 2D SOI-based photonic crystal waveguides; group index measurement; group velocity dispersion; line defect; time-of-flight method; transmission spectra; Crystalline materials; Detectors; Jacobian matrices; Nonlinear optics; Optical waveguides; Phase measurement; Photonic crystals; Silicon; Slow light; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society, 2005. LEOS 2005. The 18th Annual Meeting of the IEEE
  • Conference_Location
    Sydney, NSW
  • Print_ISBN
    0-7803-9217-5
  • Type

    conf

  • DOI
    10.1109/LEOS.2005.1548008
  • Filename
    1548008