DocumentCode :
2632602
Title :
Extreme group index measured and calculated in 2D SOI-based photonic crystal waveguides
Author :
Lavrinenko, Andrei V. ; Jacobsen, Rune S. ; Fage-Pedersen, Jacob ; Frandsen, Lars H. ; Zsigri, Beata ; Peucheret, Christophe ; Borel, Peter I.
Author_Institution :
Tech. Univ. Denmark, Lyngby
fYear :
2005
fDate :
22-22 Oct. 2005
Firstpage :
337
Lastpage :
338
Abstract :
The paper reports on the measurement and evaluation of the group velocity (GV) dispersion in the proximity of the cutoff wavelength for the fundamental photonic bandgap mode in a 2D photonic crystal waveguide (PCW). The PCW is created by introducing a line defect in an otherwise perfect triangular lattice of air-holes in the 216-nm thick silicon layer in an SOI material. Experimental transmission spectra show a mode cut-off around 1562.5 nm for the fundamental photonic bandgap mode. In order to measure and model the group index of modes in the PCW, a time-of-flight (ToF) method is applied
Keywords :
optical variables measurement; optical waveguides; photonic crystals; silicon-on-insulator; 2D SOI-based photonic crystal waveguides; group index measurement; group velocity dispersion; line defect; time-of-flight method; transmission spectra; Crystalline materials; Detectors; Jacobian matrices; Nonlinear optics; Optical waveguides; Phase measurement; Photonic crystals; Silicon; Slow light; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society, 2005. LEOS 2005. The 18th Annual Meeting of the IEEE
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-9217-5
Type :
conf
DOI :
10.1109/LEOS.2005.1548008
Filename :
1548008
Link To Document :
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