DocumentCode :
2632652
Title :
Emerging sensing techniques for emerging memories
Author :
Chen, Yiran ; Li, Hai
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Pittsburgh Pittsburgh, Pittsburgh, PA, USA
fYear :
2011
fDate :
25-28 Jan. 2011
Firstpage :
204
Lastpage :
210
Abstract :
Among all emerging memories, Spin-Transfer Torque Random Access Memory (STT-RAM) has shown many promising features such as fast access speed, nonvolatility, compatibility to CMOS process and excellent scalability. However, large process variations of both magnetic tunneling junction (MTJ) and MOS transistor severely limit the yield of STT-RAM chips. In this work, we present a recently proposed sensing technique called nondestructive self-reference read scheme (NSRS) to overcome the bit-to-bit variations in STT-RAM by leveraging the different dependencies of the high-resistance state of MTJs on the sensing current biases. Additionally, a few enhancement techniques including R-I curve skewing, yield-driven sensing current selection, and ratio matching are introduced to further improve the robustness of NSRS. The measurements of a 16Kb STT-RAM test chip shows that NSRS can significantly improve the chip yield by reducing sensing failures with high sense margin and low power consumptions.
Keywords :
CMOS memory circuits; electric sensing devices; integrated circuit testing; magnetic tunnelling; nondestructive readout; random-access storage; torque; MOS transistor; R-I curve skewing; STT-RAM test chip; emerging memories; magnetic tunneling junction; nondestructive self-reference read scheme; ratio matching; spin-transfer torque random access memory; yield-driven sensing current selection; Integrated circuits; Magnetic fields; Magnetic tunneling; Magnetization; Resistance; Sensors; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific
Conference_Location :
Yokohama
ISSN :
2153-6961
Print_ISBN :
978-1-4244-7515-5
Type :
conf
DOI :
10.1109/ASPDAC.2011.5722185
Filename :
5722185
Link To Document :
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