DocumentCode
2632681
Title
A frequent-value based PRAM memory architecture
Author
Sun, Guangyu ; Niu, Dimin ; Ouyang, Jin ; Xie, Yuan
fYear
2011
fDate
25-28 Jan. 2011
Firstpage
211
Lastpage
216
Abstract
Phase Change Random Access Memory (PRAM) has great potential as the replacement of DRAM as main memory, due to its advantages of high density, non-volatility, fast read speed, and excellent scalability. However, poor endurance and high write energy appear to be the challenges to be tackled before PRAM can be adopted as main memory. In order to mitigate these limitations, prior research focuses on reducing write intensity at the bit level. In this work, we study the data pattern of memory write operations, and explore the frequent-value locality in data written back to main memory. Based on the fact that many data are written to memory repeatedly, an architecture of frequent-value storage is proposed for PRAM memory. It can significantly reduce the write intensity to PRAM memory so that the lifetime is improved and the write energy is reduced. The trade-off between endurance and capacity of PRAM memory is explored for different configurations. After using the frequent-value storage, the endurance of PRAM is improved to about 1.6X on average, and the write energy is reduced by 20%.
Keywords
DRAM chips; memory architecture; phase change memories; DRAM; frequent-value based PRAM memory architecture; frequent-value storage; memory write operation; phase change random access memory; storage architecture; write energy; write intensity; Arrays; Computer aided manufacturing; Decoding; Phase change random access memory; Program processors;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific
Conference_Location
Yokohama
ISSN
2153-6961
Print_ISBN
978-1-4244-7515-5
Type
conf
DOI
10.1109/ASPDAC.2011.5722186
Filename
5722186
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