DocumentCode :
2633240
Title :
Image-adaptive contrast and entropy based model of regions of visible distortion
Author :
Imade, Osayamen O. ; Chandler, Damon M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Oklahoma State Univ., Stillwater, OK, USA
fYear :
2010
fDate :
23-25 May 2010
Firstpage :
65
Lastpage :
68
Abstract :
This paper presents an image adaptive algorithm for predicting regions of natural images that visually mask distortions created as a result of modification of wavelet domain coefficients. The visual error perception algorithm adaptively predicts the visual detection threshold of distortions added in the wavelet subband. Contrast masking and entropy masking properties of an image are used to generate an activity map indicating the local masking ability of the image. Ground truth data from psychophysical experiments were used to optimize the adaptive activity parameter in order to evaluate the masking thresholds of image regions. The use of this algorithm can increase the amount of watermarking data applied to an image, it is applicable for general wavelet quantization error detection and HVS based compression.
Keywords :
discrete wavelet transforms; distortion; entropy; natural scenes; optical transfer function; visual perception; watermarking; adaptive activity parameter; contrast masking; entropy masking; ground truth data; human visual system; image adaptive algorithm; image properties; image regions; local masking ability; masking thresholds; natural images; psychophysical experiments; visible distortion; visual detection threshold; visual error perception algorithm; visually mask distortions; watermarking data; wavelet domain coefficients; wavelet quantization error detection; wavelet subband; Adaptive algorithm; Entropy; Image coding; Masking threshold; Prediction algorithms; Psychology; Quantization; Watermarking; Wavelet domain; Waves; Contrast Sensitivity Function (CSF); Discrete Wavelet Transform; Human Visual System (HVS);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Analysis & Interpretation (SSIAI), 2010 IEEE Southwest Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7801-9
Type :
conf
DOI :
10.1109/SSIAI.2010.5483916
Filename :
5483916
Link To Document :
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