DocumentCode
2633246
Title
A fundamentally new approach to battery performance analysis using DFRATM/DPISTM technology
Author
Champlin, Keith S. ; Bertness, Kevin
Author_Institution
Minnesota Univ., Minneapolis, MN, USA
fYear
2000
fDate
2000
Firstpage
348
Lastpage
355
Abstract
Digital Frequency Response Analysis (DFRATM) combined with Discrete Frequency Immittance Spectroscopy (DFISTM) provides an important new technique for evaluating battery performance parameters. The cell/battery is excited with a periodic current, and its complex impedance Z (or admittance Y) is determined at the excitation´s fundamental frequency using DFRATM By measuring complex Z (or Y) at n discrete frequencies, and combining the 2n measured quantities using DFISTM, the technique evaluates elements of a unique 2n-element equivalent circuit model of the cell/battery. The 2n element values contain virtually the same information as the continuous Z (or Y) spectrum expressed over a wide frequency range. In addition, the elements themselves represent actual physical and/or electrochemical processes occurring within the cell/battery. Accordingly, their values yield potentially useful new information concerning cell/battery performance
Keywords
battery testers; cells (electric); electric impedance measurement; electrochemistry; equivalent circuits; frequency response; spectroscopy; 2n-element equivalent circuit model; DFRATM/DPISTM technology; Digital Frequency Response Analysis; Discrete Frequency Immittance Spectroscopy; battery performance analysis; complex admittance; complex impedance; electrochemical performance parameters; electrochemical processes; periodic current excitation; physical processes; Admittance measurement; Battery charge measurement; Current measurement; Electrochemical processes; Equivalent circuits; Frequency measurement; Frequency response; Impedance measurement; Performance analysis; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Telecommunications Energy Conference, 2000. INTELEC. Twenty-second International
Conference_Location
Phoenix, AZ
Print_ISBN
0-7803-6407-4
Type
conf
DOI
10.1109/INTLEC.2000.884273
Filename
884273
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