DocumentCode :
2633343
Title :
SETmap: A soft error tolerant mapping algorithm for FPGA designs with low power
Author :
Peng, Chi-Chen ; Dong, Chen ; Chen, Deming
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Champaign, IL, USA
fYear :
2011
fDate :
25-28 Jan. 2011
Firstpage :
388
Lastpage :
393
Abstract :
Field programmable gate arrays (FPGAs) are widely used in VLSI applications due to their flexibility to implement logical functions, fast total turn-around time and low none-recurring engineering cost. SRAM-based FPGAs are the most popular FPGAs in the market. However, as process technologies advance to nanometer-scale regime, the issue of reliability of devices becomes critical. Soft errors are increasingly becoming a reliability concern because of the shrinking process dimensions. In this paper we study the technology mapping problem for FPGA circuits to reduce the occurrence of soft errors under the chip performance constraint and power reduction. Compared to two power-optimization mapping algorithms, SVmap [17] and Emap [15] respectively, we reduce the soft error rate by 40.6% with a 2.22% power overhead and 48.0% with a 2.18% power overhead using 6-LUTs.
Keywords :
SRAM chips; fault tolerant computing; field programmable gate arrays; FPGA circuit; SETmap; SRAM-based FPGA design; chip performance constraint; field programmable gate arrays; power optimization mapping algorithm; soft error tolerant mapping algorithm; technology mapping problem; Cost function; Equations; Field programmable gate arrays; Logic gates; Switches; Table lookup;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific
Conference_Location :
Yokohama
ISSN :
2153-6961
Print_ISBN :
978-1-4244-7515-5
Type :
conf
DOI :
10.1109/ASPDAC.2011.5722219
Filename :
5722219
Link To Document :
بازگشت