DocumentCode
2633412
Title
Scattering Parameter Measurement Techniques in Microstrip
Author
Schallenberg, J.L. ; Beal, J.C.
Author_Institution
Queen´´s Univ., Kingston, ON, Canada
fYear
1972
fDate
22-24 May 1972
Firstpage
27
Lastpage
29
Abstract
Measurements are made on microstrip waveguides with coaxial-to-microstrip wave transitions, by means of a sliding obstacle method, and S-parameters of the transitions and the microstrip are derived for a range of frequencies from 1 to 11 GHz.
Keywords
microstrip lines; S-parameters; coaxial-to-microstrip wave transition; microstrip waveguides; scattering parameter measurement technique; sliding obstacle method; Coaxial cables; Coaxial components; Frequency measurement; Impedance; Integrated circuit interconnections; Measurement techniques; Microstrip components; Microwave devices; Scattering parameters; Waveguide transitions;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium, 1972 IEEE GMTT International
Conference_Location
Arlington Heights, IL
Type
conf
DOI
10.1109/GMTT.1972.1122981
Filename
1122981
Link To Document