DocumentCode
2633901
Title
On applying erroneous clock gating conditions to further cut down power
Author
Lam, Tak-Kei ; Yang, Xiaoqing ; Tang, Wai-Chung ; Wu, Yu-Liang
Author_Institution
Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong, China
fYear
2011
fDate
25-28 Jan. 2011
Firstpage
509
Lastpage
514
Abstract
All of today´s known clock gating techniques only disable clocks on valid (”correct”) clock gating conditions, like idle states or observability don´t cares (ODC), whose applying will not change the circuit functionality. In this paper, we explore a technique that allows shutting down certain clocks during invalid cycles, which if applied alone will certainly cause erroneous results. However, the erroneous results will be corrected either during the current or later stages by injecting other clock gating conditions to cancel out each other´s error effects before they reach the primary outputs. Under this model, conditions across multiple flip-flop stages can also be analyzed to locate easily correctable erroneous clock gating conditions. Experimental results show that by using this error cancellation technique, a total power (including dynamic and leakage power) cut of up to 23% and in average of around 6% could be stably achieved, no matter with or without applying Power Compiler (which brought a power cut of 4% in average) together. The results indicate that the power saving conditions found by this new technique were nearly orthogonal (independent) to what can be done by the popular commercial power optimization tool. The idea of these new multi-stage logic error cancellation operations can potentially be applied to other sequential logic synthesis problems as well.
Keywords
flip-flops; logic design; sequential circuits; ODC; circuit functionality; commercial power optimization tool; erroneous clock gating conditions; flip-flop stages; idle states; multistage logic error cancellation operations; observability dont cares; power compiler; power saving conditions; sequential logic synthesis problems; Benchmark testing; Circuit faults; Clocks; Latches; Logic gates; Wires; clock gating; error cancellation; logic synthesis; low power;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific
Conference_Location
Yokohama
ISSN
2153-6961
Print_ISBN
978-1-4244-7515-5
Type
conf
DOI
10.1109/ASPDAC.2011.5722243
Filename
5722243
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