DocumentCode :
2633901
Title :
On applying erroneous clock gating conditions to further cut down power
Author :
Lam, Tak-Kei ; Yang, Xiaoqing ; Tang, Wai-Chung ; Wu, Yu-Liang
Author_Institution :
Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong, China
fYear :
2011
fDate :
25-28 Jan. 2011
Firstpage :
509
Lastpage :
514
Abstract :
All of today´s known clock gating techniques only disable clocks on valid (”correct”) clock gating conditions, like idle states or observability don´t cares (ODC), whose applying will not change the circuit functionality. In this paper, we explore a technique that allows shutting down certain clocks during invalid cycles, which if applied alone will certainly cause erroneous results. However, the erroneous results will be corrected either during the current or later stages by injecting other clock gating conditions to cancel out each other´s error effects before they reach the primary outputs. Under this model, conditions across multiple flip-flop stages can also be analyzed to locate easily correctable erroneous clock gating conditions. Experimental results show that by using this error cancellation technique, a total power (including dynamic and leakage power) cut of up to 23% and in average of around 6% could be stably achieved, no matter with or without applying Power Compiler (which brought a power cut of 4% in average) together. The results indicate that the power saving conditions found by this new technique were nearly orthogonal (independent) to what can be done by the popular commercial power optimization tool. The idea of these new multi-stage logic error cancellation operations can potentially be applied to other sequential logic synthesis problems as well.
Keywords :
flip-flops; logic design; sequential circuits; ODC; circuit functionality; commercial power optimization tool; erroneous clock gating conditions; flip-flop stages; idle states; multistage logic error cancellation operations; observability dont cares; power compiler; power saving conditions; sequential logic synthesis problems; Benchmark testing; Circuit faults; Clocks; Latches; Logic gates; Wires; clock gating; error cancellation; logic synthesis; low power;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific
Conference_Location :
Yokohama
ISSN :
2153-6961
Print_ISBN :
978-1-4244-7515-5
Type :
conf
DOI :
10.1109/ASPDAC.2011.5722243
Filename :
5722243
Link To Document :
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