Title :
Layout sensitivities of transient external latchup
Author :
Kripanidhi, Arjun ; Rosenbaum, Elyse
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
The trigger current for external latchup depends on the duration of the triggering event. A physics-based model is provided to capture the effects of aggressor to victim spacing and orientation on transient triggering of external latchup. The latchup susceptibility of standard cell based designs is also investigated.
Keywords :
circuit layout; integrated circuit design; trigger circuits; aggressor; latchup susceptibility; layout sensitivity; physics-based model; standard cell based design; transient external latchup; transient triggering; trigger current; victim spacing; Anodes; Cathodes; Current measurement; Layout; Standards; Temperature measurement; Transient analysis; Latchup; PNPN; Transient External Latchup;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2012 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4577-1678-2
Electronic_ISBN :
1541-7026
DOI :
10.1109/IRPS.2012.6241821
