DocumentCode :
2634011
Title :
Test Technology Educational Program (TTEP) Tutorials
fYear :
2007
fDate :
39203
Keywords :
Circuit testing; Delay; Design engineering; Design for manufacture; Educational programs; Educational technology; Manufacturing processes; Reliability engineering; Timing; Tutorial;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location :
Berkeley, CA, USA
ISSN :
1093-0167
Print_ISBN :
0-7695-2812-0
Type :
conf
DOI :
10.1109/VTS.2007.80
Filename :
4209881
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2634011
