DocumentCode

2634028

Title

Awards

fYear

2007

fDate

6-10 May 2007

Keywords

Awards;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2007. 25th IEEE

Conference_Location

Berkeley, CA

ISSN

1093-0167

Print_ISBN

0-7695-2812-0

Type

conf

DOI

10.1109/VTS.2007.20

Filename

4209882