Title :
RF Digital Signal Generation Beyond Nyquist
Author :
Negreiros, Marcelo ; Souza, Adão, Jr. ; Carro, Luigi ; Susin, Altamiro Amadeu
Author_Institution :
Departamento de Engenharia Eletrica, Univ. Fed. do Rio Grande do Sul, Porto Alegre
Abstract :
This paper discusses low cost RF signal generation for BIST, using only digital circuits. One major problem is the range of frequencies that can be achieved by any digital signal generator, since the Nyquist limit is the clock frequency divided by 2 (FS/2). The proposed method uses the images of the signal in order to reach frequencies beyond FS/2. Different digital signal generation techniques for RF and their limitations are addressed as well as their impact in the framework of analog RF BIST. Experimental results and comparisons are provided using a gigabit transceiver
Keywords :
built-in self test; signal generators; Nyquist limit; RF signal generation; built-in self-test; digital signal generator; Built-in self-test; CMOS technology; Circuit testing; Clocks; Costs; Delta-sigma modulation; Frequency conversion; RF signals; Radio frequency; Signal generators;
Conference_Titel :
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7695-2812-0
DOI :
10.1109/VTS.2007.54
