Title :
Pruning-based trace signal selection algorithm
Author :
Zhao, Kang ; Bian, Jinian
Author_Institution :
Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Abstract :
To improve the observability in the post-silicon validation, how to select the limited trace signals effectively for the data acquisition is the focus. This paper proposes an automated trace signal selection algorithm, which uses the pruning-based strategy to reduce the exploration space. The experiments indicate that the proposed algorithm can bring higher restoration ratios, and it is more effective compared to existing methods.
Keywords :
integrated circuit design; integrated circuit testing; silicon; data acquisition; post-silicon validation; pruning-based strategy; trace signal selection; Arrays; Generators; Industries; Integrated circuits; Logic gates; Silicon; Space exploration;
Conference_Titel :
Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-1-4244-7515-5
DOI :
10.1109/ASPDAC.2011.5722267