DocumentCode
2634347
Title
A review of real-time soft-error rate measurements in electronic circuits
Author
Autran, J.L. ; Munteanu, D. ; Serre, S. ; Sauze, S.
Author_Institution
IM2NP Inst., Aix-Marseille Univ., Marseille, France
fYear
2012
fDate
15-19 April 2012
Abstract
The real-time (or life testing) soft-error rate (SER) measurement is an experimental reliability technique to determine the SER from the monitoring of a population of devices subjected to the natural radiation environment and operating under nominal conditions. This review presentation gives a survey over different real-time SER experiments conducted in altitude and/or underground over the past decade. We discuss the specific advantages and limitations of this approach as well as its comparison with accelerated tests using intense particle beams or sources.
Keywords
integrated circuit testing; life testing; radiation hardening (electronics); accelerated tests; electronic circuits; intense particle beams; life testing; natural radiation environment; real-time SER experiments; real-time SER measurement; real-time soft-error rate measurements; CMOS integrated circuits; Life estimation; Neutrons; Random access memory; Real time systems; Reliability; Testing; SRAM; altitude; atmospheric neutrons; life testing; multiple cell upset; real-time testing; single-event upset; soft-error rate; undergound;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2012 IEEE International
Conference_Location
Anaheim, CA
ISSN
1541-7026
Print_ISBN
978-1-4577-1678-2
Electronic_ISBN
1541-7026
Type
conf
DOI
10.1109/IRPS.2012.6241843
Filename
6241843
Link To Document