• DocumentCode
    2634347
  • Title

    A review of real-time soft-error rate measurements in electronic circuits

  • Author

    Autran, J.L. ; Munteanu, D. ; Serre, S. ; Sauze, S.

  • Author_Institution
    IM2NP Inst., Aix-Marseille Univ., Marseille, France
  • fYear
    2012
  • fDate
    15-19 April 2012
  • Abstract
    The real-time (or life testing) soft-error rate (SER) measurement is an experimental reliability technique to determine the SER from the monitoring of a population of devices subjected to the natural radiation environment and operating under nominal conditions. This review presentation gives a survey over different real-time SER experiments conducted in altitude and/or underground over the past decade. We discuss the specific advantages and limitations of this approach as well as its comparison with accelerated tests using intense particle beams or sources.
  • Keywords
    integrated circuit testing; life testing; radiation hardening (electronics); accelerated tests; electronic circuits; intense particle beams; life testing; natural radiation environment; real-time SER experiments; real-time SER measurement; real-time soft-error rate measurements; CMOS integrated circuits; Life estimation; Neutrons; Random access memory; Real time systems; Reliability; Testing; SRAM; altitude; atmospheric neutrons; life testing; multiple cell upset; real-time testing; single-event upset; soft-error rate; undergound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2012 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4577-1678-2
  • Electronic_ISBN
    1541-7026
  • Type

    conf

  • DOI
    10.1109/IRPS.2012.6241843
  • Filename
    6241843