DocumentCode
2634352
Title
Conditioning circuit for precise SiC capacitive pressure sensors
Author
Lian, Zhang ; Jinsong, Yu ; Hao, Liu
Author_Institution
Sch. of Autom. Sci. & Electr. Eng., BeiHang Univ., Beijing, China
fYear
2011
fDate
21-23 June 2011
Firstpage
559
Lastpage
563
Abstract
Capacitive pressure sensor has many advantages, such as high sensitivity, low temperature drifting and low power consumption. In this paper, capacitive pressure sensor is used as pressure sensor. This paper analyzes SiC MEMS capacitive sensor´s features and introduces its conditioning circuit. This sensor has widely commercial exploitation because of its small size and outstanding chemical stability as well as its mechanical character for harsh industrial environment application. Capacitance of this sensor varies at fF or pF degree. As a result, exploitation of such high sensitive capacitive pressure sensor is inhibited by parasitic capacitance in conditioning circuit. Integrated conditioning circuit is introduced for those high-sensitivity capacitive pressure sensors. Measures taken to reduce parasitic capacitance are described in the paper. Experience results give the range and linear area of this sensor.
Keywords
capacitive sensors; pressure sensors; silicon compounds; capacitive pressure sensors; chemical stability; commercial exploitation; conditioning circuit; mechanical character; parasitic capacitance; Capacitance; Capacitance measurement; Capacitive sensors; Silicon carbide; Temperature measurement; Temperature sensors; SiC MEMS; capacitive sensors; circuits noise; conditioning circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications (ICIEA), 2011 6th IEEE Conference on
Conference_Location
Beijing
ISSN
pending
Print_ISBN
978-1-4244-8754-7
Electronic_ISBN
pending
Type
conf
DOI
10.1109/ICIEA.2011.5975648
Filename
5975648
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