DocumentCode
2634356
Title
Safety Assessment of Design Patterns for Safety-Critical Embedded Systems
Author
Armoush, Ashraf ; Beckschulze, Eva ; Kowalewski, Stefan
Author_Institution
Embedded Software Lab., RWTH Aachen Univ., Aachen, Germany
fYear
2009
fDate
27-29 Aug. 2009
Firstpage
523
Lastpage
527
Abstract
System safety is considered as one of the most important non-functional requirements for safety-critical embedded systems. Several safety assessment methods have been proposed to evaluate safety-critical systems. However, most of them cannot be used to assess safety-critical design patterns due to the fact that these patterns do not address real systems but present abstract solutions to commonly recurring design problems. This paper introduces a proposal for a safety assessment method for safety-critical systems design patterns. This method includes a safety metric based on the computation of the relative safety improvement achieved when using the design patterns under consideration. A Monte Carlo based simulation method is used to illustrate the new proposed assessment method which allows to compare them with respect to their impact on safety.
Keywords
Monte Carlo methods; embedded systems; object-oriented programming; safety-critical software; software metrics; software process improvement; Monte Carlo based simulation method; nonfunctional requirements; safety assessment methods; safety improvement; safety metric; safety-critical design patterns; safety-critical embedded systems; system safety; Application software; Computational modeling; Design methodology; Embedded software; Embedded system; Laboratories; Monte Carlo methods; Proposals; Software engineering; Software safety; Design Pattern; Safety Assessment; Safety-Critical;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering and Advanced Applications, 2009. SEAA '09. 35th Euromicro Conference on
Conference_Location
Patras
ISSN
1089-6503
Print_ISBN
978-0-7695-3784-9
Type
conf
DOI
10.1109/SEAA.2009.12
Filename
5350015
Link To Document