• DocumentCode
    2634356
  • Title

    Safety Assessment of Design Patterns for Safety-Critical Embedded Systems

  • Author

    Armoush, Ashraf ; Beckschulze, Eva ; Kowalewski, Stefan

  • Author_Institution
    Embedded Software Lab., RWTH Aachen Univ., Aachen, Germany
  • fYear
    2009
  • fDate
    27-29 Aug. 2009
  • Firstpage
    523
  • Lastpage
    527
  • Abstract
    System safety is considered as one of the most important non-functional requirements for safety-critical embedded systems. Several safety assessment methods have been proposed to evaluate safety-critical systems. However, most of them cannot be used to assess safety-critical design patterns due to the fact that these patterns do not address real systems but present abstract solutions to commonly recurring design problems. This paper introduces a proposal for a safety assessment method for safety-critical systems design patterns. This method includes a safety metric based on the computation of the relative safety improvement achieved when using the design patterns under consideration. A Monte Carlo based simulation method is used to illustrate the new proposed assessment method which allows to compare them with respect to their impact on safety.
  • Keywords
    Monte Carlo methods; embedded systems; object-oriented programming; safety-critical software; software metrics; software process improvement; Monte Carlo based simulation method; nonfunctional requirements; safety assessment methods; safety improvement; safety metric; safety-critical design patterns; safety-critical embedded systems; system safety; Application software; Computational modeling; Design methodology; Embedded software; Embedded system; Laboratories; Monte Carlo methods; Proposals; Software engineering; Software safety; Design Pattern; Safety Assessment; Safety-Critical;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering and Advanced Applications, 2009. SEAA '09. 35th Euromicro Conference on
  • Conference_Location
    Patras
  • ISSN
    1089-6503
  • Print_ISBN
    978-0-7695-3784-9
  • Type

    conf

  • DOI
    10.1109/SEAA.2009.12
  • Filename
    5350015