Title :
A Programmable Window Comparator for Analog Online Testing
Author :
Laknaur, Amit ; Xiao, Rui ; Wang, Haibo
Author_Institution :
Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL
Abstract :
This paper discusses the challenge of designing window comparators for analog online testing applications. A programmable window comparator with adaptive error threshold is presented. Experimental results demonstrate that improved fault detection capability is achieved by using the proposed design. Measurement results of the fabricated comparator circuit are also presented.
Keywords :
analogue circuits; comparators (circuits); fault diagnosis; field programmable analogue arrays; adaptive error threshold; analog online testing; fault detection; field programmable analogue arrays; programmable window comparator; Analog circuits; CMOS technology; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Field programmable analog arrays; Hardware; Inverters; Switches;
Conference_Titel :
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7695-2812-0
