DocumentCode
2634394
Title
A Programmable Window Comparator for Analog Online Testing
Author
Laknaur, Amit ; Xiao, Rui ; Wang, Haibo
Author_Institution
Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL
fYear
2007
fDate
6-10 May 2007
Firstpage
119
Lastpage
124
Abstract
This paper discusses the challenge of designing window comparators for analog online testing applications. A programmable window comparator with adaptive error threshold is presented. Experimental results demonstrate that improved fault detection capability is achieved by using the proposed design. Measurement results of the fabricated comparator circuit are also presented.
Keywords
analogue circuits; comparators (circuits); fault diagnosis; field programmable analogue arrays; adaptive error threshold; analog online testing; fault detection; field programmable analogue arrays; programmable window comparator; Analog circuits; CMOS technology; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Field programmable analog arrays; Hardware; Inverters; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location
Berkeley, CA
ISSN
1093-0167
Print_ISBN
0-7695-2812-0
Type
conf
DOI
10.1109/VTS.2007.8
Filename
4209900
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