مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2634439

Title :

Session Abstract

fYear :

2007

fDate :

39203

Firstpage :

141

Lastpage :

141

Abstract :

This session will address various aspects of system test: Characterization of No-Trouble-Found (NTF) devices and the use of system test for high test quality.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

VLSI Test Symposium, 2007. 25th IEEE

Conference_Location :

Berkeley, CA, USA

ISSN :

1093-0167

Print_ISBN :

0-7695-2812-0

Type :

conf

DOI :

10.1109/VTS.2007.71

Filename :

4209903

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2634439