DocumentCode
2634482
Title
Product reliability at low failure rates: Wrong expectations and real limitations
Author
Kanert, Werner
Author_Institution
IFAG ATV QM QE, Infineon Technol., Neubiberg, Germany
fYear
2012
fDate
15-19 April 2012
Abstract
The automotive industry serves as a prominent example for high reliability requirements under harsh application conditions. Reliability assessment is torn between expectations from customers and what it can realistically achieve, reliability testing being limited by both technical and economical reasons. Furthermore, reliability methodology on package and product level severely lags behind what we have become accustomed to on the wafer technology side. The paper looks at some of the issues and implications when assessment of low failure rates is required.
Keywords
automotive components; automotive electronics; failure analysis; semiconductor device reliability; automotive industry; low failure rate assessment; product reliability; reliability assessment; wafer technology; Acceleration; Failure analysis; Life estimation; Qualifications; Semiconductor device reliability; Stress; Reliability; automotive; failure rate; qualification;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2012 IEEE International
Conference_Location
Anaheim, CA
ISSN
1541-7026
Print_ISBN
978-1-4577-1678-2
Electronic_ISBN
1541-7026
Type
conf
DOI
10.1109/IRPS.2012.6241851
Filename
6241851
Link To Document