DocumentCode :
2634597
Title :
Session Abstract
fYear :
2007
fDate :
39203
Firstpage :
195
Lastpage :
195
Abstract :
Panels are designed to get opinions of test experts on focused topics. They are usually designed to have significant audience interaction. In this panel, we recognize that one topic is stretched too long in an hour and a half format and since the primary questions are from an audience the directions of the discussion is not methodical. To address these shortcomings a new talk show like format is defined for this panel.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location :
Berkeley, CA, USA
ISSN :
1093-0167
Print_ISBN :
0-7695-2812-0
Type :
conf
DOI :
10.1109/VTS.2007.65
Filename :
4209912
Link To Document :
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