DocumentCode
2634626
Title
An Analysis of Defect Detection for Weighted Random Patterns Generated with Observation/Excitation-Aware Partial Fault Targeting
Author
Dworak, Jennifer
Author_Institution
Brown Univ., Providence, RI
fYear
2007
fDate
6-10 May 2007
Firstpage
205
Lastpage
210
Abstract
Fortuitous detection increases with multiple site observations and good excitation balance. However, this increases test data volume. The authors investigate weighted random patterns generated with partial fault targeting and show that they may be equally or more effective at fortuitous detection than an ATPG set with the same minimal site observations.
Keywords
automatic test pattern generation; fault diagnosis; ATPG; automatic test pattern generation; defect detection; partial fault targeting; Automatic test pattern generation; Bridge circuits; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Hardware; Logic; Pattern analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location
Berkeley, CA
ISSN
1093-0167
Print_ISBN
0-7695-2812-0
Type
conf
DOI
10.1109/VTS.2007.14
Filename
4209914
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