• DocumentCode
    2634626
  • Title

    An Analysis of Defect Detection for Weighted Random Patterns Generated with Observation/Excitation-Aware Partial Fault Targeting

  • Author

    Dworak, Jennifer

  • Author_Institution
    Brown Univ., Providence, RI
  • fYear
    2007
  • fDate
    6-10 May 2007
  • Firstpage
    205
  • Lastpage
    210
  • Abstract
    Fortuitous detection increases with multiple site observations and good excitation balance. However, this increases test data volume. The authors investigate weighted random patterns generated with partial fault targeting and show that they may be equally or more effective at fortuitous detection than an ATPG set with the same minimal site observations.
  • Keywords
    automatic test pattern generation; fault diagnosis; ATPG; automatic test pattern generation; defect detection; partial fault targeting; Automatic test pattern generation; Bridge circuits; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Hardware; Logic; Pattern analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2007. 25th IEEE
  • Conference_Location
    Berkeley, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-2812-0
  • Type

    conf

  • DOI
    10.1109/VTS.2007.14
  • Filename
    4209914