DocumentCode
2634675
Title
Accelerating Diagnosis via Dominance Relations between Sets of Faults
Author
Adapa, Rajsekhar ; Tragoudas, Spyros ; Michael, Maria K.
Author_Institution
Dept. of ECE, Southern Illinois Univ., Carbondale, IL
fYear
2007
fDate
6-10 May 2007
Firstpage
219
Lastpage
224
Abstract
A new way of fault collapsing for effect-cause diagnosis is presented. In contrast to existing dominance-based methods which operate on a pair of faults, the proposed method operates on pairs of sets of faults. The impact of the proposed method is evaluated with respect to effect-cause diagnosis. Experimental results show that the proposed collapsing methods can reduce the diagnostic simulation time on an average of 31% when compared to the existing techniques
Keywords
fault simulation; integrated circuit testing; effect-cause diagnosis; fault collapsing; fault diagnosis; Acceleration; Algorithm design and analysis; Cause effect analysis; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Failure analysis; Fault detection; Fault diagnosis;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location
Berkeley, CA
ISSN
1093-0167
Print_ISBN
0-7695-2812-0
Type
conf
DOI
10.1109/VTS.2007.10
Filename
4209916
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