• DocumentCode
    2634675
  • Title

    Accelerating Diagnosis via Dominance Relations between Sets of Faults

  • Author

    Adapa, Rajsekhar ; Tragoudas, Spyros ; Michael, Maria K.

  • Author_Institution
    Dept. of ECE, Southern Illinois Univ., Carbondale, IL
  • fYear
    2007
  • fDate
    6-10 May 2007
  • Firstpage
    219
  • Lastpage
    224
  • Abstract
    A new way of fault collapsing for effect-cause diagnosis is presented. In contrast to existing dominance-based methods which operate on a pair of faults, the proposed method operates on pairs of sets of faults. The impact of the proposed method is evaluated with respect to effect-cause diagnosis. Experimental results show that the proposed collapsing methods can reduce the diagnostic simulation time on an average of 31% when compared to the existing techniques
  • Keywords
    fault simulation; integrated circuit testing; effect-cause diagnosis; fault collapsing; fault diagnosis; Acceleration; Algorithm design and analysis; Cause effect analysis; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Failure analysis; Fault detection; Fault diagnosis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2007. 25th IEEE
  • Conference_Location
    Berkeley, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-2812-0
  • Type

    conf

  • DOI
    10.1109/VTS.2007.10
  • Filename
    4209916