DocumentCode
2634809
Title
Silicon Evaluation of Static Alternative Fault Models
Author
Schuermyer, Chris ; Pangilinan, Jewel ; Jahangiri, Jay ; Keim, Martin ; Rajski, Janusz ; Benware, Brady
Author_Institution
LSI Logic Corp., Gresham, OR
fYear
2007
fDate
6-10 May 2007
Firstpage
265
Lastpage
270
Abstract
This paper presents an extensive study on evaluating the effects of static alternative fault models (AFM) on product quality in the face of the latest defect screening techniques. The fault models that are presented in this research are multiple-detect stuck-at, static transition fault, and layout-based deterministic bridges. The results show the quality impact when these new fault models are combined with a high quality stuck-at and TDF test sets
Keywords
fault simulation; integrated circuit modelling; logic testing; defect screening; layout-based deterministic bridges; multiple-detect stuck-at fault; product quality; silicon evaluation; static alternative fault models; static transition fault; Automatic test pattern generation; Bridges; Fault detection; Fault diagnosis; Large scale integration; Logic; Production; Silicon; Testing; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location
Berkeley, CA
ISSN
1093-0167
Print_ISBN
0-7695-2812-0
Type
conf
DOI
10.1109/VTS.2007.74
Filename
4209923
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