• DocumentCode
    2635216
  • Title

    Automated Design and Insertion of Optimal One-Hot Bus Encoders

  • Author

    Wohl, Peter ; Waicukauski, John A. ; Patel, Sanjay

  • fYear
    2007
  • fDate
    6-10 May 2007
  • Firstpage
    409
  • Lastpage
    415
  • Abstract
    Tristate buses, commonly used in high-performance designs, raise testability problems because one-hot conditions, required for functional operation, may not be maintained during scan testing. We present a novel method to automatically generate and insert a bus encoder that ensures one-hot bus operation. Each bus is analyzed individually; a customized encoder is then generated and optimized for best testability and minimal area and delay. We introduce two new bus encoder designs which form the basis of a hierarchically algorithm that scales up to any number of bus inputs.
  • Keywords
    automatic test pattern generation; boundary scan testing; logic design; system buses; automated design; automated insertion; bus encoder designs; customized encoder; high-performance designs; optimal one-hot bus encoders; raise testability problems; scan testing; tristate buses; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Decoding; Delay; Design for testability; Driver circuits; Logic design; Logic testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2007. 25th IEEE
  • Conference_Location
    Berkeley, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-2812-0
  • Type

    conf

  • DOI
    10.1109/VTS.2007.18
  • Filename
    4209946