Title :
Automated Design and Insertion of Optimal One-Hot Bus Encoders
Author :
Wohl, Peter ; Waicukauski, John A. ; Patel, Sanjay
Abstract :
Tristate buses, commonly used in high-performance designs, raise testability problems because one-hot conditions, required for functional operation, may not be maintained during scan testing. We present a novel method to automatically generate and insert a bus encoder that ensures one-hot bus operation. Each bus is analyzed individually; a customized encoder is then generated and optimized for best testability and minimal area and delay. We introduce two new bus encoder designs which form the basis of a hierarchically algorithm that scales up to any number of bus inputs.
Keywords :
automatic test pattern generation; boundary scan testing; logic design; system buses; automated design; automated insertion; bus encoder designs; customized encoder; high-performance designs; optimal one-hot bus encoders; raise testability problems; scan testing; tristate buses; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Decoding; Delay; Design for testability; Driver circuits; Logic design; Logic testing;
Conference_Titel :
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7695-2812-0
DOI :
10.1109/VTS.2007.18