DocumentCode
2635216
Title
Automated Design and Insertion of Optimal One-Hot Bus Encoders
Author
Wohl, Peter ; Waicukauski, John A. ; Patel, Sanjay
fYear
2007
fDate
6-10 May 2007
Firstpage
409
Lastpage
415
Abstract
Tristate buses, commonly used in high-performance designs, raise testability problems because one-hot conditions, required for functional operation, may not be maintained during scan testing. We present a novel method to automatically generate and insert a bus encoder that ensures one-hot bus operation. Each bus is analyzed individually; a customized encoder is then generated and optimized for best testability and minimal area and delay. We introduce two new bus encoder designs which form the basis of a hierarchically algorithm that scales up to any number of bus inputs.
Keywords
automatic test pattern generation; boundary scan testing; logic design; system buses; automated design; automated insertion; bus encoder designs; customized encoder; high-performance designs; optimal one-hot bus encoders; raise testability problems; scan testing; tristate buses; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Decoding; Delay; Design for testability; Driver circuits; Logic design; Logic testing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location
Berkeley, CA
ISSN
1093-0167
Print_ISBN
0-7695-2812-0
Type
conf
DOI
10.1109/VTS.2007.18
Filename
4209946
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