• DocumentCode
    2635405
  • Title

    Fully integrated active magnetic probe for high-definition near-field measurement

  • Author

    Aoyama, Satoshi ; Kawahito, Shoji ; Yamaguchi, Masahiro

  • Author_Institution
    Shizuoka University
  • Volume
    2
  • fYear
    2006
  • fDate
    14-18 Aug. 2006
  • Firstpage
    426
  • Lastpage
    429
  • Keywords
    CMOS technology; Coils; Differential amplifiers; Electromagnetic interference; Integrated circuit measurements; Integrated circuit noise; Magnetic field measurement; Magnetic flux; Magnetic shielding; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
  • Conference_Location
    Portland, OR, USA
  • Print_ISBN
    1-4244-0293-X
  • Type

    conf

  • DOI
    10.1109/ISEMC.2006.1706340
  • Filename
    1706340
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2635405