DocumentCode :
2635405
Title :
Fully integrated active magnetic probe for high-definition near-field measurement
Author :
Aoyama, Satoshi ; Kawahito, Shoji ; Yamaguchi, Masahiro
Author_Institution :
Shizuoka University
Volume :
2
fYear :
2006
fDate :
14-18 Aug. 2006
Firstpage :
426
Lastpage :
429
Keywords :
CMOS technology; Coils; Differential amplifiers; Electromagnetic interference; Integrated circuit measurements; Integrated circuit noise; Magnetic field measurement; Magnetic flux; Magnetic shielding; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
Type :
conf
DOI :
10.1109/ISEMC.2006.1706340
Filename :
1706340
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2635405
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