• DocumentCode
    2635439
  • Title

    Author index

  • fYear
    2007
  • fDate
    6-10 May 2007
  • Firstpage
    482
  • Lastpage
    482
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2007. 25th IEEE
  • Conference_Location
    Berkeley, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-2812-0
  • Type

    conf

  • DOI
    10.1109/VTS.2007.17
  • Filename
    4209959
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2635439