DocumentCode
2635588
Title
The amplitude of random telegraph noise: Scaling implications
Author
Cheung, Kin P. ; Campbell, J.P. ; Potbhare, S. ; Oates, A.
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear
2012
fDate
15-19 April 2012
Abstract
We introduce a simple and intuitive model to relate the amplitude of random telegraph noise (RTN) fluctuations to the columbic influence of single trap charges on the inversion layer. The prediction of this model is in excellent agreement with results extracted from experiment using the “hole-in-the-inversion-layer” model for RTN amplitude. This new model allows us to quantitatively examine the impact of “worst-case” RTN in future scaling nodes.
Keywords
noise; telegraphy; RTN amplitude; columbic influence; excellent agreement; hole-in-the-inversion-layer model; intuitive model; inversion layer; random telegraph noise fluctuation; scaling implication; single trap charges; Dielectrics; Fluctuations; Logic gates; Mathematical model; Noise; Semiconductor device modeling; Semiconductor process modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2012 IEEE International
Conference_Location
Anaheim, CA
ISSN
1541-7026
Print_ISBN
978-1-4577-1678-2
Electronic_ISBN
1541-7026
Type
conf
DOI
10.1109/IRPS.2012.6241908
Filename
6241908
Link To Document