DocumentCode :
2635668
Title :
From post-breakdown conduction to resistive switching effect in thin dielectric films
Author :
Miranda, E. ; Jiménez, D. ; Suñé, J.
Author_Institution :
Dept. d´´Eng. Electron., Univ. Autonoma de Barcelona, Barcelona, Spain
fYear :
2012
fDate :
15-19 April 2012
Abstract :
The hysteretic nature of the filamentary electron transport in MIM/MIS resistive switching devices is modeled within the framework of the Landauer theory for mesoscopic conductors. It is shown that a two-equation system, one equation for the current-voltage (I-V) characteristic of a nano-sized constriction and a second equation for the time dependence of the confining potential yield the wide variety of I-V hysteretic behaviors reported in literature. The proposed model is consistent with a number of experimental observations and is a clear example of a nonlinear memristive system. Moreover, because of its mathematical simplicity and flexibility it is well-suited for circuit simulators.
Keywords :
memristors; semiconductor switches; thin films; Landauer theory; MIM/MIS resistive switching device; circuit simulators; current-voltage characteristic; filamentary electron transport; mathematical simplicity; mesoscopic conductors; nanosized constriction; nonlinear memristive system; post-breakdown conduction; resistive switching effect; thin dielectric films; two-equation system; Electric breakdown; Equations; Materials; Mathematical model; Memristors; Resistance; Switches; memristor; oxide breakdown; post-breakdown; reliability; resistive switching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium (IRPS), 2012 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1541-7026
Print_ISBN :
978-1-4577-1678-2
Electronic_ISBN :
1541-7026
Type :
conf
DOI :
10.1109/IRPS.2012.6241912
Filename :
6241912
Link To Document :
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