DocumentCode :
2635973
Title :
Guiding feature subset selection with an interactive visualization
Author :
May, Thorsten ; Bannach, Andreas ; Davey, James ; Ruppert, Tobias ; Kohlhammer, Jörn
Author_Institution :
Fraunhofer Inst. for Comput. Graphics Res., Darmstadt, Germany
fYear :
2011
fDate :
23-28 Oct. 2011
Firstpage :
111
Lastpage :
120
Abstract :
We propose a method for the semi-automated refinement of the results of feature subset selection algorithms. Feature subset selection is a preliminary step in data analysis which identifies the most useful subset of features (columns) in a data table. So-called filter techniques use statistical ranking measures for the correlation of features. Usually a measure is applied to all entities (rows) of a data table. However, the differing contributions of subsets of data entities are masked by statistical aggregation. Feature and entity subset selection are, thus, highly interdependent. Due to the difficulty in visualizing a high-dimensional data table, most feature subset selection algorithms are applied as a black box at the outset of an analysis. Our visualization technique, SmartStripes, allows users to step into the feature subset selection process. It enables the investigation of dependencies and interdependencies between different feature and entity subsets. A user may even choose to control the iterations manually, taking into account the ranking measures, the contributions of different entity subsets, as well as the semantics of the features.
Keywords :
data analysis; data visualisation; statistical analysis; SmartStripes; data analysis; entity subset selection; feature correlation; feature subset selection algorithms; filter techniques; high-dimensional data table visualization; interactive visualization; statistical aggregation; statistical ranking measures; Algorithm design and analysis; Atmospheric measurements; Correlation; Data visualization; Particle measurements; Sorting; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Visual Analytics Science and Technology (VAST), 2011 IEEE Conference on
Conference_Location :
Providence, RI
Print_ISBN :
978-1-4673-0015-5
Type :
conf
DOI :
10.1109/VAST.2011.6102448
Filename :
6102448
Link To Document :
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