• DocumentCode
    2635982
  • Title

    Temperature- and Cost-Aware Design of 3D Multiprocessor Architectures

  • Author

    Coskun, Ayse K. ; Kahng, Andrew B. ; Rosing, Tajana Simunic

  • Author_Institution
    Univ. of California, San Diego, CA, USA
  • fYear
    2009
  • fDate
    27-29 Aug. 2009
  • Firstpage
    183
  • Lastpage
    190
  • Abstract
    3D stacked architectures provide significant benefits in performance, footprint and yield. However, vertical stacking increases the thermal resistances, and exacerbates temperature-induced problems that affect system reliability, performance, leakage power and cooling cost. In addition, the overhead due to through-silicon-vias (TSVs) and scribe lines contribute to the overall area, affecting wafer utilization and yield. As any of the aforementioned parameters can limit the 3D stacking process of a multiprocessor SoC (MPSoC), in this work we investigate the tradeoffs between cost and temperature profile across various technology nodes. We study how the manufacturing costs change when the number of layers, defect density, number of cores, and power consumption vary. For each design point, we also compute the steady state temperature profile, where we utilize temperature-aware floorplan optimization to eliminate the adverse effects of inefficient floorplan decisions on temperature. Our results provide guidelines for temperature-aware floorplanning in 3D MPSoCs. For each technology node, we point out the desirable design points from both cost and temperature standpoints. For example, for building a many-core SoC with 64 cores at 32 nm, stacking 2 layers provides a desirable design point. On the other hand, at 45 nm technology, stacking 3 layers keeps temperatures at an acceptable range while reducing the cost by an additional 17% in comparison to 2 layers.
  • Keywords
    integrated circuit layout; multiprocessing systems; optimisation; system-on-chip; 3D MPSoCs; 3D multiprocessor architectures; 3D stacking; cost-aware design; multiprocessor SoC; power consumption; size 32 nm; size 45 nm; steady state temperature profile; temperature-aware design; temperature-aware floorplanning optimization; Cooling; Costs; Design optimization; Energy consumption; Manufacturing; Reliability; Stacking; Steady-state; Temperature; Thermal resistance; 3D; floorplanning; multiprocessor; yield;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital System Design, Architectures, Methods and Tools, 2009. DSD '09. 12th Euromicro Conference on
  • Conference_Location
    Patras
  • Print_ISBN
    978-0-7695-3782-5
  • Type

    conf

  • DOI
    10.1109/DSD.2009.233
  • Filename
    5350101