DocumentCode :
2636004
Title :
Predicting TEM cell measurements from near field scan data
Author :
Weng, Haixiao ; Beetner, Daryl G. ; Dubroff, Richard E.
Author_Institution :
University of Missouri-Rolla
Volume :
3
fYear :
2006
fDate :
14-18 Aug. 2006
Firstpage :
560
Lastpage :
564
Keywords :
Electric variables measurement; Electromagnetic measurements; Electromagnetic modeling; IEC standards; Integrated circuit measurements; Magnetic field measurement; Predictive models; Probes; Semiconductor device measurement; TEM cells;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
Type :
conf
DOI :
10.1109/ISEMC.2006.1706371
Filename :
1706371
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2636004
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