DocumentCode
2636070
Title
A New Method for Measuring Dielectric Properties of Material Media Using a Microstrip Cavity
Author
Itoh, Tatsuo ; Mittra, Raj
fYear
1973
fDate
4-6 June 1973
Firstpage
138
Lastpage
139
Abstract
A new method for non-destructive testing has been developed for measuring the dielectric constant and the dissipation factor of a slab-type material using a microstrip line cavity. The method has several advantages and yields accurate results with a simple procedure.
Keywords
Capacitance; Conducting materials; Dielectric materials; Dielectric measurements; Frequency measurement; Microstrip; Q factor; Q measurement; Resonance; Resonant frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium, 1973 IEEE G-MTT International
Conference_Location
Boulder, CO, USA
Type
conf
DOI
10.1109/GMTT.1973.1123124
Filename
1123124
Link To Document