Title :
A New Method for Measuring Dielectric Properties of Material Media Using a Microstrip Cavity
Author :
Itoh, Tatsuo ; Mittra, Raj
Abstract :
A new method for non-destructive testing has been developed for measuring the dielectric constant and the dissipation factor of a slab-type material using a microstrip line cavity. The method has several advantages and yields accurate results with a simple procedure.
Keywords :
Capacitance; Conducting materials; Dielectric materials; Dielectric measurements; Frequency measurement; Microstrip; Q factor; Q measurement; Resonance; Resonant frequency;
Conference_Titel :
Microwave Symposium, 1973 IEEE G-MTT International
Conference_Location :
Boulder, CO, USA
DOI :
10.1109/GMTT.1973.1123124
