DocumentCode :
2636151
Title :
Organic Thin Film Transistor degradation under sunlight exposure
Author :
Wrachien, N. ; Cester, A. ; Bari, D. ; Meneghesso, G. ; Kovac, J. ; Jakabovic, J. ; Donoval, D.
Author_Institution :
Dept. of Inf. Eng., Univ. of Padova, Padova, Italy
fYear :
2012
fDate :
15-19 April 2012
Abstract :
We irradiated Organic Thin-Film Transistors with wavelengths ranging in the visible and near ultraviolet parts of the solar spectrum, reporting strong degradation in few hours. We modeled the sunlight-induced permanent degradation, taking into account the mobility reduction. The model closely fits the experimental data, allowing the prediction of the device permanent degradation under sunlight exposure.
Keywords :
semiconductor device reliability; solar radiation; thin film transistors; mobility reduction; organic thin film transistor degradation; solar spectrum; sunlight exposure; sunlight induced permanent degradation; Charge carrier processes; Degradation; Organic thin film transistors; Pentacene; Photonics; Radiation effects; irradiation; organic devices; reliability; thin-film-transistor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium (IRPS), 2012 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1541-7026
Print_ISBN :
978-1-4577-1678-2
Electronic_ISBN :
1541-7026
Type :
conf
DOI :
10.1109/IRPS.2012.6241936
Filename :
6241936
Link To Document :
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