Title :
Parallel Algorithms for Testing Length Four Permutations
Author :
Yijie Han ; Saxena, Shanky
Author_Institution :
Sch. of Comput. & Eng., Univ. of Missouri at Kansas City, Kansas City, MO, USA
Abstract :
We present new parallel algorithms for testing pattern involvement for all length 4 permutations. Our algorithmshave the complexity of O(log n) time with n/log nprocessors on the CREW PRAM model, O(logloglog n) timewith n/logloglog n processors or constant time and nlog3 nprocessors on a CRCW PRAM model. Parallel algorithms werenot designed before for some of these patterns and for otherpatters the previous best algorithms require O(log n) time and n processors on the CREW PRAM model.
Keywords :
computational complexity; mathematics computing; parallel algorithms; set theory; CREW PRAM model; O(log n) time complexity; length four permutation; n/log n processors; parallel algorithms; pattern involvement testing; Arrays; Indexes; Parallel algorithms; Phase change random access memory; Program processors; Silicon; Testing; Separable permutations; length 4 permutations; parallel algorithms; pattern matching;
Conference_Titel :
Parallel Architectures, Algorithms and Programming (PAAP), 2014 Sixth International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-3844-5
DOI :
10.1109/PAAP.2014.46
