Parallel Algorithms for Testing Length Four Permutations

Author

Yijie Han ; Saxena, Shanky

Author_Institution

Sch. of Comput. & Eng., Univ. of Missouri at Kansas City, Kansas City, MO, USA

fYear

2014

fDate

13-15 July 2014

Firstpage

81

Lastpage

86

Abstract

We present new parallel algorithms for testing pattern involvement for all length 4 permutations. Our algorithmshave the complexity of O(log n) time with n/log nprocessors on the CREW PRAM model, O(logloglog n) timewith n/logloglog n processors or constant time and nlog3 nprocessors on a CRCW PRAM model. Parallel algorithms werenot designed before for some of these patterns and for otherpatters the previous best algorithms require O(log n) time and n processors on the CREW PRAM model.

Keywords

computational complexity; mathematics computing; parallel algorithms; set theory; CREW PRAM model; O(log n) time complexity; length four permutation; n/log n processors; parallel algorithms; pattern involvement testing; Arrays; Indexes; Parallel algorithms; Phase change random access memory; Program processors; Silicon; Testing; Separable permutations; length 4 permutations; parallel algorithms; pattern matching;

fLanguage

English

Publisher

ieee

Conference_Titel

Parallel Architectures, Algorithms and Programming (PAAP), 2014 Sixth International Symposium on

Conference_Location

Beijing

ISSN

2168-3034

Print_ISBN

978-1-4799-3844-5

Type

conf

DOI

10.1109/PAAP.2014.46

Filename

6916441