• DocumentCode
    2636340
  • Title

    Analysts aren´t machines: Inferring frustration through visualization interaction

  • Author

    Harrison, Lane ; Dou, Wenwen ; Lu, Aidong ; Ribarsky, William ; Wang, Xiaoyu

  • Author_Institution
    Comput. Sci., UNC - Charlotte, Charlotte, NC, USA
  • fYear
    2011
  • fDate
    23-28 Oct. 2011
  • Firstpage
    279
  • Lastpage
    280
  • Abstract
    Recent work in visual analytics has explored the extent to which information regarding analyst action and reasoning can be inferred from interaction. However, these methods typically rely on humans instead of automatic extraction techniques. Furthermore, there is little discussion regarding the role of user frustration when interacting with a visual interface. We demonstrate that automatic extraction of user frustration is possible given action-level visualization interaction logs. An experiment is described which collects data that accurately reflects user emotion transitions and corresponding interaction sequences. This data is then used in building HiddenMarkov Models (HMMs) which statistically connect interaction events with frustration. The capabilities of HMMs in predicting user frustration are tested using standard machine learning evaluation methods. The resulting classifier serves as a suitable predictor of user frustration that performs similarly across different users and datasets.
  • Keywords
    data analysis; data visualisation; graphical user interfaces; hidden Markov models; learning (artificial intelligence); pattern classification; action-level visualization interaction logs; analyst action; analyst reasoning; classifier; hidden Markov models; interaction sequences; machine learning evaluation methods; user emotion transitions; user frustration; visual analytics; visual interface; visualization interaction; Accuracy; Data visualization; Face; Hidden Markov models; Humans; Predictive models; Visual analytics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Visual Analytics Science and Technology (VAST), 2011 IEEE Conference on
  • Conference_Location
    Providence, RI
  • Print_ISBN
    978-1-4673-0015-5
  • Type

    conf

  • DOI
    10.1109/VAST.2011.6102473
  • Filename
    6102473