DocumentCode
2636362
Title
A realistic mechatronic system applied on the detection of optical information for CMOS-MEMS reflective micro grating
Author
Tsai, Chien-Chung ; Zhong, Guang-Wei ; Liu, Chi-Tsang
Author_Institution
Dept. of Optoelectron. Syst. Eng., Minghsin Univ. of Sci. & Technol., Hsinchu, Taiwan
fYear
2011
fDate
21-23 June 2011
Firstpage
1134
Lastpage
1139
Abstract
The study proposed a realistic mechatronic system to detect the optical information for CMOS-MEMS reflective micro grating. The different diffraction patterns with the various angles for the micro grating loaded on the stepping motor were exploited. Further the relationships between the diffraction patterns and resolving power with various elevation angles were investigated. For improving the image resolving power, the micro grating loaded on the shaft of stepping motor can be elevated to produce a different diffraction at the smallest stepping angle 3\´23". Through the comparison with theory and experimental results, NI LabVIEW and Vision Builder AI control an automation measurement system which is reliable and powerful for the micro grating optical information detection. A mechatronic system realistically demonstrated the high precision motion control performance for the micro device.
Keywords
CMOS integrated circuits; diffraction gratings; integrated optics; light diffraction; mechatronics; micro-optics; micromechanical devices; optical control; virtual instrumentation; CMOS-MEMS reflective micro grating; NI LabVIEW; Vision Builder AI control; automation measurement system; different diffraction patterns; high precision motion control; image resolving power; micro grating optical information detection; realistic mechatronic system; shaft; stepping motor; Diffraction; Diffraction gratings; Etching; Gratings; Metals; Optical imaging; Optical reflection; Diffraction; LabVIEW; Micro grating; Resolving Power;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications (ICIEA), 2011 6th IEEE Conference on
Conference_Location
Beijing
ISSN
pending
Print_ISBN
978-1-4244-8754-7
Electronic_ISBN
pending
Type
conf
DOI
10.1109/ICIEA.2011.5975757
Filename
5975757
Link To Document