DocumentCode :
2636362
Title :
A realistic mechatronic system applied on the detection of optical information for CMOS-MEMS reflective micro grating
Author :
Tsai, Chien-Chung ; Zhong, Guang-Wei ; Liu, Chi-Tsang
Author_Institution :
Dept. of Optoelectron. Syst. Eng., Minghsin Univ. of Sci. & Technol., Hsinchu, Taiwan
fYear :
2011
fDate :
21-23 June 2011
Firstpage :
1134
Lastpage :
1139
Abstract :
The study proposed a realistic mechatronic system to detect the optical information for CMOS-MEMS reflective micro grating. The different diffraction patterns with the various angles for the micro grating loaded on the stepping motor were exploited. Further the relationships between the diffraction patterns and resolving power with various elevation angles were investigated. For improving the image resolving power, the micro grating loaded on the shaft of stepping motor can be elevated to produce a different diffraction at the smallest stepping angle 3\´23". Through the comparison with theory and experimental results, NI LabVIEW and Vision Builder AI control an automation measurement system which is reliable and powerful for the micro grating optical information detection. A mechatronic system realistically demonstrated the high precision motion control performance for the micro device.
Keywords :
CMOS integrated circuits; diffraction gratings; integrated optics; light diffraction; mechatronics; micro-optics; micromechanical devices; optical control; virtual instrumentation; CMOS-MEMS reflective micro grating; NI LabVIEW; Vision Builder AI control; automation measurement system; different diffraction patterns; high precision motion control; image resolving power; micro grating optical information detection; realistic mechatronic system; shaft; stepping motor; Diffraction; Diffraction gratings; Etching; Gratings; Metals; Optical imaging; Optical reflection; Diffraction; LabVIEW; Micro grating; Resolving Power;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics and Applications (ICIEA), 2011 6th IEEE Conference on
Conference_Location :
Beijing
ISSN :
pending
Print_ISBN :
978-1-4244-8754-7
Electronic_ISBN :
pending
Type :
conf
DOI :
10.1109/ICIEA.2011.5975757
Filename :
5975757
Link To Document :
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