Proposal of a method of skin region detection by two near wavelengths of near intrared

Especially, detection of skin region is one of the important process of the face detection. Skin region is usually detected by using the skin color. However, this method has some problems which are influence of lighting condition and etc. Therefore we paid attention to difference of the reflectance characteristic of materials. We proposed a skin detection method directly by the reflection characteristic. In this paper, we propose a method to reduce influences of the disturbance light by using one band pass filter. The usefulness in confirmed by a skin detection experiment.