DocumentCode :
2636464
Title :
Experimental characterization of relationship between s parameters and radiated emission for solid and EBG types of power bus structures
Author :
Sudo, Toshio ; Kato, Toshimi ; Ichijo, Seiju
Author_Institution :
Toshiba Corporation
Volume :
3
fYear :
2006
fDate :
14-18 Aug. 2006
Firstpage :
692
Lastpage :
695
Keywords :
CMOS logic circuits; Capacitors; Insulation; Metamaterials; Periodic structures; Power supplies; Printed circuits; Routing; Scattering parameters; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
Type :
conf
DOI :
10.1109/ISEMC.2006.1706398
Filename :
1706398
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2636464
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