Title :
Modeling and simulation of IC and package power/ground network
Author :
Park, Hyunjeong ; Gam, Dong Gun ; Kim, Joungho ; Kim, Hyungsoo
Author_Institution :
Korea Advanced Institute of Science and Technology
Keywords :
Equivalent circuits; Frequency; Integrated circuit modeling; Integrated circuit noise; Integrated circuit packaging; MOS capacitors; Noise generators; Power generation; Semiconductor device noise; Semiconductor device packaging;
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
DOI :
10.1109/ISEMC.2006.1706399
