• DocumentCode
    2636617
  • Title

    Voltage control devices on the IEEE 8500 node test feeder

  • Author

    Schneider, K.P. ; Fuller, J.C.

  • Author_Institution
    Battelle Seattle Res. Center, Pacific Northwest Nat. Lab., Seattle, WA, USA
  • fYear
    2010
  • fDate
    19-22 April 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The IEEE Test Cases provide researchers with distribution system models that can be used to validate new analytic methods. The newest of these models is the 8500-node test feeder which contains multiple devices for voltage control. In addition to a substation regulator there are multiple inline regulators as well as capacitor banks. This paper will discuss the detail in which voltage control devises should be modeled when examining large distribution systems. This discussion will include issues associated with power flow analysis for a single time step as well as for time series analysis.
  • Keywords
    Capacitors; Centralized control; Large-scale systems; Load flow analysis; Power system modeling; Regulators; Substations; System testing; Topology; Voltage control; Gauss-Seidel; distribution system analysis; forwardbackward sweep method; power modeling; power simulation; smart grid;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transmission and Distribution Conference and Exposition, 2010 IEEE PES
  • Conference_Location
    New Orleans, LA, USA
  • Print_ISBN
    978-1-4244-6546-0
  • Type

    conf

  • DOI
    10.1109/TDC.2010.5484225
  • Filename
    5484225