Title :
Model-to-hardware correlation of physics based via models with the parallel plate impedance included
Author :
Selli, Giuseppe ; Schuster, Christian ; Kwark, Young
Author_Institution :
University of Missouri-Rolla
Keywords :
Circuit synthesis; Electromagnetic fields; Electromagnetic propagation; Geometry; Impedance; Insertion loss; Loss measurement; Physics; Probes; Stripline;
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
DOI :
10.1109/ISEMC.2006.1706416
