Title :
Signal Integrity and Power Integrity Methodology for Robust Analysis of On-the-Board System for High Speed Serial Links
Author :
Nagpal, Raj Kumar ; Malik, Rakesh ; Tripathi, Jai Narayan
Author_Institution :
STMicroelectronics, Noida, India
Abstract :
Integrated System Level Simulations of high speed serial links are necessary for the channel reliability and robustness. Increasing data rates and sharp transition time require high bandwidth systems. System level simulation are required to optimize channel design keeping cost of implementation at moderate or low level while meeting system level channel bit error rate requirement for high bandwidth systems. The parameters which influence the channel and it´s interconnect environment are primarily governed by signal integrity and power integrity requirements. In this paper, system level robustness analysis of high speed serial links is demonstrated with external environment considerations taken into account. A strong correlation between measured and simulated results is shown. A generic methodology for high speed serial links is presented with complete analysis of package, board, termination, signal quality inrush Droop/Drop (SQiDD), decoupling network etc.
Keywords :
integrated circuit interconnections; integrated circuit reliability; optimisation; transceivers; bit error rate requirement; channel reliability; decoupling network; high-bandwidth systems; high-speed serial links; integrated system level simulations; interconnect environment; on-the-board system; optimize channel design; power integrity; signal integrity; signal quality inrush droop-drop; system level robustness analysis; Bandwidth; Bit error rate; Cost function; Design optimization; Packaging; Power system interconnection; Power system reliability; Robustness; Signal analysis; Surges; High Speed Serial Links; On-the-Board System; Power Integrity; Robust Analysis; Signal Integrity;
Conference_Titel :
Digital System Design, Architectures, Methods and Tools, 2009. DSD '09. 12th Euromicro Conference on
Conference_Location :
Patras
Print_ISBN :
978-0-7695-3782-5
DOI :
10.1109/DSD.2009.130