DocumentCode :
2636941
Title :
Transactions Sequence Tracking by means of Dynamic Binary Instrumentation of TLM Models
Author :
Silva, Antonio Da ; Sánchez, Sebastián
Author_Institution :
Univ. Politec. de Madrid, Madrid, Spain
fYear :
2009
fDate :
27-29 Aug. 2009
Firstpage :
723
Lastpage :
728
Abstract :
Several traditional VHDL fault injection mechanisms like mutants or saboteurs have been adapted to SystemC model descriptions. The main drawback of these approaches is the necessity of source code modification to carry out the fault injection campaigns. In this paper, we propose the use of Dynamic Binary Instrumentation (DBI) to insert binary transaction saboteurs in SystemC TLM models. DBI is a technique to intercept software routine calls allowing argument and return value corruption and data structures modification at runtime. This technique needs neither source code modifications nor recompilation of target modules in order to insert/remove saboteurs in the signal communication path. To validate this approach a protocol tracker in a TLM2.0 model is inserted in order to generate runtime UML Sequence Diagrams describing the interchanged transactions in a graphical an attractive way allowing an easy visual verification of expected behavior.
Keywords :
Unified Modeling Language; data structures; SystemC; argument value corruption; binary transaction saboteurs; data structures; dynamic binary instrumentation; interchanged transactions; protocol tracker; return value corruption; runtime UML sequence diagrams; signal communication path; software routine; transaction level modeling; transaction sequence tracking; unified modeling language; Digital systems; Genetic mutations; Hardware; Instruments; Object oriented modeling; Runtime; Software testing; Software tools; System testing; Unified modeling language; Dynamic Binary Instrumentation; Reverse Sequence Diagram; Transaction Level;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital System Design, Architectures, Methods and Tools, 2009. DSD '09. 12th Euromicro Conference on
Conference_Location :
Patras
Print_ISBN :
978-0-7695-3782-5
Type :
conf
DOI :
10.1109/DSD.2009.206
Filename :
5350161
Link To Document :
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